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Fault Simulator Based Test and Diagnostics Development1. UUT is modeled for input to LASAR or HITS which are digital simulation tools. 2. The digital simulator produces appropriate "good circuit" output response (at edge) to user-defined stimulus patterns, plus "good circuit" values for all internal nodes at each "time segment." 3. The fault simulator simulates user-defined faults and creates a fault dictionary. (which contains signature of edge pins for each of the simulated fault conditions) 4. The results are compared to the fault dictionary table provided by the fault simulator. The results of this comparison are provided as the final result or as the working set for a guided probe process. 5. The guided probe uses the "good circuit" values produced by the simulator for all internal nodes to exhaustively, on a pin by pin basis, check out the value at each pin, to back-trace (from the edge back or within the fault dictionary results), the source of the fault. It does this until it finds where the signal went from good to bad. It actually verifies fault location by testing until it finds where the signal is good. |
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