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Demonstration Scenario Our Diagnostician for LabVIEW demonstration uses a Diagnostic Knowledge Base (DKB) for a printed circuit board called "221." The test program has four types of tests: safe to turn on tests, functional, or end-to-end tests, diagnostic tests that are made from a test connector (J-Connector) and probing tests. The test program first runs through the safe to turn on tests and then the functional test is run. The results of the STTO and functional tests are fed to the Diagnostician. There are four (4) STTO tests which include measurements at seventeen (17) different locations. There are eight (8) functional tests which include measurements at thirty-nine (39) locations. Two test philosophies can be applied: stop on first failure and immediately branch into diagnostic tests, or perform all functional tests and if a fault exists, branch into diagnostic tests. The test philosophy used in this scenario is to run the STTO and functional tests first. If no failure, the unit is shipped. Upon failure, the complete J-Connector (edge) tests are run since they all require the same setup on the ATE and the test time is relatively short. There are 14 J Connector tests which have measurements at twenty-nine (29) locations. All 29 test results are fed to the Diagnostician and fault isolation call-out is requested through the Diagnostician function library. If a fault call-out is a single component, then the UUT is tagged and sent for repair and replacement. If there is an ambiguity group, the Diagnostician is called upon to operate with the test program in an interactive mode, selecting tests for probing to most quickly resolve the ambiguity group to a single component. In this case, it is important to recognize that the "next best test" algorithm is effective in this probing scenario, whereas in the exercise of the functional and J-Connector tests, the patented reasoning algorithms are used. |
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